SIM-RUC
Surface & Interface Modeling
for Emerging Nanomaterials and Devices

Repulsion-Induced Surface-Migration, by Ballistics and Bounce

Si Yue Guo1, Stephen J Jenkins2, Wei Ji3, Zhanyu Ning1, John C Polanyi1*, Marco Sacchi2, Chen-Guang Wang1,3

1 Lash Miller Chemical Laboratories, Department of Chemistry and Institute of Optical Sciences, University of Toronto, 80 St. George Street, Toronto, Ontario, M5S 3H6, Canada.
2 Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge, CB2 1EW, United Kingdom.
3 Department of Physics and Beijing Key Laboratory of Optoelectronic Functional Materials & Micro-nano Devices, Renmin University of China, Beijing 100872, China.

DOI:10.1021/acs.jpclett.5b01829    Publication Date: 


Abstract:

The motion of adsorbate molecules across surfaces is fundamental to self-assembly, material growth and heterogeneous catalysis. Recent Scanning Tunneling Microscopy studies have demonstrated the electron-induced long-range surface-migration of ethylene, benzene and related molecules, moving tens of Angstroms across Si(100). We present a model of the previously unexplained long-range recoil of chemisorbed ethylene across the surface of silicon. The molecular dynamics reveal two key elements for directed long-range migration: first 'ballistic' motion that causes the molecule to leave the ab initio slab of the surface travelling 3-8 Å above it out of range of its roughness, and thereafter skipping-stone 'bounces' that transport it further to the observed long distances. Using a previously tested impulsive two-state model, we predict comparable long-range recoil of atomic chlorine following electron-induced dissociation of chlorophenyl chemisorbed at Cu(110).


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View: J. Phys. Chem. Lett.  6, pp 4093–4098 (2015)     Local Copy

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